Using burn-in and test sockets to address issues in product assessment,
electrical properties, and reliability testing of various devices.

Socket for burn-in MCU

Supported Packages

device2

IC Socket Solution.com’s sockets for burn-in MCUs are inexpensive sockets made from molded products. A shoulder rest type that eliminates damage to the solder mounting surface of the PKG lead, or a two-point contact type that makes contact by sandwiching the tip of the PKG lead is available to achieve high contact reliability. If the PKG has a heat dissipation tab, a heat dissipation pin is also provided on the socket side to transfer heat to the board to dissipate heat, or to air-cool the heat dissipation pin for direct heat dissipation. We will solve all your worries when you burn in test your MCU.

Points

For burn-in MCU sockets, it is necessary to select the optimum specifications depending on the usage method, usage environment, and important functions. Here, we will introduce the important points in determining the specifications of the socket for burn-in MCUs.

Point#1

Select either open top or clamshell from the method of setting the device

Select the open top type when moving the device in and out by machine, and the clamshell type when inserting and removing it by hand.

Point#2

If long life and contact stability are important, select contact pin plating.

In the case of mass-produced burn-in, long-term and repeated use is expected, so it is essential to extend the service life. If the device’s PKG lead plating is Sn-based, select ES-plated contact pins.

Point#3

If you need high heat dissipation, select the heat dissipation pin

If you are concerned about thermal runaway due to the heat generated by the PKG during the burn-in test, and if your device has a heat dissipation PAD, be sure to select the heat dissipation pin in conjunction with the heat dissipation simulation.

Issues

Issue #1

Thermal runaway due to PKG's self-heating

Devices with high self-heating of PKG may cause thermal runaway during burn-in tests in high temperature environments. If this happens, you will not be able to perform a burn-in test.

Solutions

Heat dissipation simulation by thermal analysis + Heat dissipation with heat dissipation pin!

Issue #2

The ball and pin do not make good contact

Sockets and devices are elaborately crafted, but if the PKG warps during the burn-in test, the position of the ball may change and pinching with contact pins may not work, resulting in poor contact. If good contact is not possible, the burn-in test will not work, so it is necessary to devise ways to ensure stable contact even if the PKG warps.

Solutions

Two-point contact method Improves contact reliability with contact pins

Issue #3

Yield drops due to repeated BI

When using standard Au-plated contact pins, the tin plating of PKG leads is transferred and peeled off to the contact pins due to repeated BI processes, exposing the base of the contact pins, resulting in loss of contact.

Solutions

Increased contact pin life and yield by ES plating

Examples of Solutions for
Socket for burn-in MCU

Supported Packages

Solutions

IC Socket Solutions.com offers IC socket solutions that apply a wealth of experience and simulation technology to all the challenges that arise when burn-in testing an MCU.

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Inquiries
device

IC Socket Solution.com’s sockets for test MCUs contact the lead terminals with contacts for electrical connection, and employ probe pins and press pins as contacts. Assuming that the PKG is pressed by the handler, this model has an open top surface of the socket, and it is possible to manufacture a cover for pressing the PKG for manual use. In addition, for models that use a surface pressure welding method that is easy to maintain, and for sockets that use press pins, the combination of a resin molded housing and a machined socket frame has realized cost reduction.

Since the contact holder holding part (unit, resin molded housing) is removable, it is possible to replace all contact pins by replacing the holding part, or to replace only one specific pin.

Points

For the socket for the test MCU, it is necessary to select the optimum specifications according to the usage method, usage environment, and important functions. Here, we will introduce the important points in determining the specifications of the socket for the test MCU.

Point#1

Select with / without cover depending on how to use the test socket

If you want to use it in a mass production test site, it will be a model without a cover, but if you want to use it in manual evaluation, select a model with a cover. The cover can be removed.

Point#2

Select a dedicated contact method for micro signal evaluation

Devices that handle minute signals, such as MCUs, cannot accurately pick up signals using the contact pins used in ordinary test sockets. In that case, use a Kelvin contact dedicated to minute signals.

Issues

Issue #1

Cannot reliably evaluate micro signal characteristics

In the electrical characteristics test of the MCU, it is necessary to confirm whether it works with a minute signal, but it is not possible to reliably evaluate the minute signal characteristics with a contact pin for a normal test socket.

Solutions

Uses Kelvin contact pins that can cancel the effect of contact pins on PKG characteristics

Issue #2

Frequent replacement due to wear and solder adhesion of contact pins

Since it is used repeatedly in mass production tests, if the contact pin is a standard beryllium copper plated with gold, wear and Sn adhesion will progress at the tip of the pin, and as a result, poor contact is likely to occur.

Solutions

The carbon coating prevents solder transfer, extending the life of contact pins.

Issue #3

I want to carry out mass production tests at high temperatures in a stable manner.

The standard type contact pins are gold-plated beryllium copper, but in a high-temperature test environment, solder adheres to the gold plating quickly, plating peeling / base exposure occurs, and contact failure is likely to occur.

Solutions

The carbon coating prevents solder transfer, extending the life of contact pins.

Examples of Solutions for
Socket for burn-in MCU

Supported Packages

Solutions

IC Socket Solution.com provides IC socket solution that applies abundant achievements and simulation technology to all the problems that occur when conducting the final test of MCU.

Kelvin Contact

TypePitchPin NumberMold
Press Pin0.5487x7
649.8x9.8
10014x14
11614x20
12814x20
0.657014x25
9214x20
10014x20
Probe Pin0.512814x20

Single Contact

TypePitchPin NumberMold
Press Pin
0.84410x10
0.6510014x20
0.6510014x14
12814x20
Probe Pin0.56410x10
12814x20
14420x20

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Inquiries