Terminology

A Burn-in (BI) socket is a specific type of socket used in reliability evaluation tests, particularly in burn-in testing, which involves temperature and voltage trials. These sockets are designed to accommodate electronic components like semiconductors during the burn-in process, where they are subjected to elevated temperatures and electrical stress. The purpose is to accelerate the aging of the components, identifying and eliminating potential early failures. This ensures that only components with proven durability and reliability are passed on for further use or sale. Burn-in sockets are crucial for maintaining quality and reliability in the electronics industry.