Terminology

Burn-in Testing (BT) refers to a testing process for electrical equipment, electronic components, and semiconductors, where temperature and voltage stress are applied to identify and eliminate early failures before shipment. Recently, tests incorporating current load have also become common. By removing early failures, the batch of products can maintain high quality over an extended period without entering the wear-out failure region, thereby ensuring high reliability. The products are less likely to exhibit initial failures in the market, significantly reducing the early failure rate.

Furthermore, conducting pre-shipment burn-in tests on all products demands high-quality manufacturing and design, as these tests are rigorous and simulate harsh environmental conditions. This rigorous testing ensures that no failures occur due to the strenuous conditions, thereby upholding the overall quality and reliability of the products.