Solving problems with burn-in sockets and test sockets
with latest solutions
Are you worried about measures against heat generation, high temperature, large current, and high frequency?
Abundant proposals for cost reduction such as durability, yield,
and workability improvement
We also offer custom products that combine standard lineups
and solutions for all PKGs.
Reasons for Choosing ICSocketSolutions.com Reasons
Providing
Cutting Edge SolutionsWith an Eye on Global Semiconductor Manufacturing Trends
View Our Cutting Edge Solutions
Providing Replete and Advanced Solutions with IC Sockets to
Address Various Customer Issues
Resolving Issues
Employing Advanced Simulation Technologies for
Swift and Reliable
Product Development
See Product Development
Solution Menu Menu
Choose by PKG
Choose by device
Latest Information News
-
2024.10.10
IC Socket Technical Information
Explanation of Temperature Cycling Test (TCT) added to IC Socket Technical Information.
-
2024.09.27
IC Socket Technical Information
The surface mounting method of IC sockets Explanation of terminal shape, PKG type and type added to IC Socket Technical Information.
-
2024.07.1
IC Socket Technical Information
Explanation of the Features and Mechanism of the Temperature Humidity Bias (THB) Test added to IC Socket Technical Information.
-
2024.07.1
IC Socket Technical Information
Explanation of the Features and Mechanism of the High Accelerated Stress Test (HAST) added to IC Socket Technical Information.
-
2024.06.26
IC Socket Technical Information
What is a burn-in test? added to IC Socket Technical Information.
Latest solutions solutions
-
High-voltage (10,000V) insulation test socket.
The high-voltage test socket supports up to 10,000V and features developed large-stroke press and probe pins. We also offer a variety of contacts for different currents and can provide custom solutions.
-
IGBT Test Socket
Stable contact performance (1000A) with high current terminals for AC/DC testing. Reduced contact marks and high durability with press contacts for insulation testing.
-
High-Frequency Socket for System-Level Testing
Enhanced Grounding and Excellent High-Frequency Characteristics Achieved by Plating the Housing
Supports PAM4 Serdes 112Gbps Operation -
High Pin Count Solutions
Achieves stable contact performance and long life.
High current capacity is possible with integrated springs. -
Spring Kelvin Contact
Achieves stable contact performance and long life.
High current capacity is possible with integrated springs. -
QFP/SOP Open Top Socket with Ground Pins
Stable Contact Performance with Cantilever Structure (2-Point Contact)
Ground Pins for Continuity Testing and Heat Dissipation Pins for High-Heat Packages -
Spring Probe Pin
Enplas's own design will provide internal short circuit of probe pin with low resistance value (Ave 50m ohm or under)
Enplas provides suitable socket design proposal to meet required specification -
Curling Contact Series
Cost saving solution with the same performance as probe pin
Long stroke pin which works for device warpage in accordance with recent large size device